iDO: Compiler-Directed Failure Atomicity for Nonvolatile Memory

Published in The 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO 2018)

Qingrui Liu, Joseph Izraelevitz, Se Kwon Lee, Michael L. Scott, Sam H. Noh, and Changhee Jung, iDO: Compiler-Directed Failure Atomicity for Nonvolatile Memory, Proceedings of the 51st Annual IEEE/ACM International Symposium on Microarchitecture (MICRO 2018).

[paper]